NanoEx-i/v

Specimen heating & biasing holder for in situ S/TEM imaging and elemental analysis at elevated temperatures.

FEI's new heating solution will expand the capability of your FEI microscope. NanoEx-i/v is the ideal solution for precise experiments in a wide range of applications that require in situ heating of nanomaterial, such as studies of nanoscale annealing behavior, of phase transformations in metals, of structural changes and sintering phenomena in catalyst nanosystems, of quenching, of segregation/diffusion phenomena, and more.

FEI now provides an in situ heating solution specifically designed for the FEI  microscope platform- making research faster, easier, and reproducible since components are guaranteed to work seamlessly together. 

NanoEx-i/v is optimized for use on FEI's Talos, Titan Themis 200/300 and Titan Themis3 300. It is also available for retrofit on earlier FEI TEM platforms.





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Key Benefits:

Do you require atomic resolution in situ experiments? 

When using classical furnace-based S/TEM heating holder, researchers who are working with samples at elevated temperatures can experience increased drift and reduced resolution during their in situ experiments.

 

FEI's NanoEx-i/v TEM single-tilt holder is a MEMS-based solution that significantly improves stability for heating and biasing applications to enable S/TEM experiments with atomic resolution.

Achieve the most accurate monitoring your experiment parameters 

Designed to accept a variety of samples, from nanoparticles to FIB-prepared lamellas, NanoEx-i/v offers precise built-in heating control and uniform temperature distribution over the heated area.

Conduct simultaneous heating, biasing and/or EDS experiments 

NanoEx-i/v allows you to combine your heating experiments with electrical measurements to deliver a greater range of data from your materials samples. Optimization with FEI's ChemiSTEM™ Technology enables analysis of compositional changes correlated with temperature and electrical stimuli. 

 
 
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Introduction to the NanoEx Holder

 

Application Example

 

The ability to perform compositional analysis for in situ elemental characterization of nanomaterials, both at room temperature and during heating, provides important insight to structural and compositional changes. In this use case, we demonstrate the use of NanoEx-i/v in the dynamic inter-diffusion process of Silicon through an Aluminum oxide interlayer which results in the growth of large crystalline grains of Silicon, used to design solar cells and transistors. To understand the compositional and structural changes induced by the applied heating, the Al and Si elemental live maps were acquired at every temperature.

 
 
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Application Example: Talos TEM & NanoEx Holder

 

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