Globally, large investments are being made in development of metals products for transportation infrastructure and vehicles, energy production and machinery, building materials and even consumer products. These investments are fueled by the need to develop metals that are lighter, stronger and more durable throughout their use.

To fully understand all of the properties of steel or alloys requires technology with workflows that provide visibility at multiple scales, to reveal structure and composition, as well as any possible defects, in the full context of the area in which they occur.

Materials Scientists working in metals research are using FEI solutions to gain a deeper understanding of not only the physical properties of steel and alloys, but also to be able to predict their performance in real world conditions. Using workflows to gain understanding of structure-property relationships, from macro to atomic scale, these scientists are making the discoveries that are leading to cleaner production, safer, more durable products and new applications for metals. 

New Teneo SEM

New Teneo SEM delivers highest throughput for high resolution imaging and analytical applications. For materials that are difficult to image, like magnetic and non-conductive samples, the Teneo easily delivers high contrast, high resolution images to get you answers, fast, while still offering the highest quality performance for traditional SEM samples.

Learn more about Teneo SEM.

New Helios PFIB DualBeam™

New Helios PFIB DualBeam, FEI's first plasma based FIB/SEM, is designed for high throughput, large volume processing, combined with extreme high resolution imaging in both 2D and 3D. Providing the highest quality of data in the shortest time, Helios PFIB DualBeam is the ideal research partner for a variety of materials science applications such as large scale cross-sectioning, large volume 3D data collection or large scale patterning.

 Learn more about Helios PFIB.

Featured Product

New Talos™ TEM

Talos TEM delivers fast, high throughput STEM images that reveal atomic structure, defects, grain and interface structure of various materials, including metals and alloys, and enables you to perform rapid, precise, quantitative EDS analysis to uncover the chemical composition of these materials. Learn more about Talos TEM and how this new research partner can help you to deliver breakthroughs in Metals research.

Discover Automated Inclusion Analysis for Steel Production 

With the Metals Quality Analyzer, you have the power to make quality control decisions faster and more economically than ever before. Now, you can automatically detect, analyze, classify and document thousands of non-metallic inclusions per hour.  

Learn more


3-D Materials Characterization over a Range of Time and Length Scales

Learn how the University of Manchester is using their suite of FEI instruments to solve materials research challenges in multiple scales and dimensions.

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Products for Metals

Titan Themis

Get fast, easy access to atomic-scale information.

  • Proven aberration-corrected optics
  • Outstanding XEDS performance
  • Powerful new software
  • 16 megapixel CMOS camera
  • Enhanced Piezo stage 
Scios DualBeam

Take your lab to the next level of achievement.

  • Fast, high resolution 2D and 3D characterization-even for magnetic and non-conductive samples
  • Clear distinction between materials and topographic contrast
  • Rapid creation of site-specific samples for S/TEM, EBSD, or atom probe.
Helios NanoLab 600i

Meet your most stringent 2D and 3D nanoscale characterization, prototyping, and sample preparation needs.

  • Ultra to extreme high-resolution monochromated FE-SEM technology
  • Best-in-class FIB performance
  • Especially well-suited for soft or delicate materials, like nanotubes, polymers, particles, ceramics and metals
Quanta SEM

Image any sample; collect all data with this highly versatile SEM

  • High and low vacuum modes, plus Environmental SEM (ESEM) operation
  • Imaging and analysis of samples in their natural states
  • Supports in situ dynamic experiments, including heating, humidity cycling and tensile testing
Verios XHR SEM

Get unprecedented precision and surface-specific information.

  • Second-generation XHR SEM technology
  • Sub-nanometer resolution over the full 1 keV to 30 keV energy range
  • Excellent materials contrast
  • Extraordinary low-voltage performance 

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