Globally, large investments are being made in development of metals products for transportation infrastructure and vehicles, energy production and machinery, building materials and even consumer products. These investments are fueled by the need to develop metals that are lighter, stronger and more durable throughout their use.

To fully understand all of the properties of steel or alloys requires technology with workflows that provide visibility at multiple scales, to reveal structure and composition, as well as any possible defects, in the full context of the area in which they occur.

Materials Scientists working in metals research are using FEI solutions to gain a deeper understanding of not only the physical properties of steel and alloys, but also to be able to predict their performance in real world conditions. Using workflows to gain understanding of structure-property relationships, from macro to atomic scale, these scientists are making the discoveries that are leading to cleaner production, safer, more durable products and new applications for metals. 

New Teneo SEM

New Teneo SEM delivers highest throughput for high resolution imaging and analytical applications. For materials that are difficult to image, like magnetic and non-conductive samples, the Teneo easily delivers high contrast, high resolution images to get you answers, fast, while still offering the highest quality performance for traditional SEM samples.

Learn more about Teneo SEM.

New Helios PFIB DualBeam™

New Helios PFIB DualBeam, FEI's first plasma based FIB/SEM, is designed for high throughput, large volume processing, combined with extreme high resolution imaging in both 2D and 3D. Providing the highest quality of data in the shortest time, Helios PFIB DualBeam is the ideal research partner for a variety of materials science applications such as large scale cross-sectioning, large volume 3D data collection or large scale patterning.

 Learn more about Helios PFIB.

Featured Product

New Talos™ TEM

Talos TEM delivers fast, high throughput STEM images that reveal atomic structure, defects, grain and interface structure of various materials, including metals and alloys, and enables you to perform rapid, precise, quantitative EDS analysis to uncover the chemical composition of these materials. Learn more about Talos TEM and how this new research partner can help you to deliver breakthroughs in Metals research.

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Discover Automated Inclusion Analysis for Steel Production 

With the Metals Quality Analyzer, you have the power to make quality control decisions faster and more economically than ever before. Now, you can automatically detect, analyze, classify and document thousands of non-metallic inclusions per hour.  

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3-D Materials Characterization over a Range of Time and Length Scales

Learn how the University of Manchester is using their suite of FEI instruments to solve materials research challenges in multiple scales and dimensions.

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Products for Metals

Titan Themis for Materials Science

Designed for excellence in high throughput, atomic scale chemical and structural analysis, Titan Themis combines proven spherical aberration (Cs)-correctors, monochromator system and sensitive ChemiSTEM™ technology with the new enhanced piezo stage, FEI Velox™ software, and FEI Ceta 16-megapixel CMOS camera-delivering the fastest navigation and instant-zoom to link details from the mesoscopic to the atomic length scales.


Scios for Materials Science
The Scios is FEI's newest DualBeam featuring an electron column specifically designed to perform high throughput two-dimensional (2D) and three-dimensional (3D) characterization of all materials, including insulating or magnetic materials. It also includes the new Trinity™ detector suite, comprising of three highly-efficient, in-lens detectors, offering the broadest range of sample information simultaneously. The Focused Ion Beam enables site specific, fast milling of highest quality, ultra thin lamella to meet any S/TEM application requirement.
Quanta SEM for Materials Science
The Quanta 50 series is the third generation Quanta system built on the success of previous generations of ESEM Schottky FEG. This series has an easy-to-use and flexible user interface with functions to maximize productivity and allow all the data to be collected. Designed by microscopists for microscopists, this instrument series is truly above and beyond 'easy to use'.
Verios XHR SEM for Materials Science
The Verios™ 460 XHR is the second generation of FEI’s leading XHR SEM family. It provides sub-nanometer resolution from 500eV to 30 keV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing, Life - & Materials Science applications, and low beam currents for delicate biological samples in Life Sciences.

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