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MAPS High-throughput Correlative Workflow

 

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Product Overview
MAPS™ is a modular software package that turns your FEI scanning electron microscope (SEM) or DualBeam™ microscope into a high-throughput data production device. At the foundation, is an application environment that lets you automate data acquisition and processing in a workflow-centric manner such that the quality of the results are indistinguishable from those acquired manually.  MAPS handles data acquisition, presentation, and storage in a highly customizable workflow, delivering versatility while creating automated, efficient and high quality data acquisition.

Key Features:

  • Produce custom data acquisition workflows that are automated and specific to your data acquisition needs, saving you time
  • Record a series of tiled images from a large field of view easily and in a fully automated manner
  • Produce high quality, stitched images the first time that can be as a large as gigapixels in range, and are output in compatible formats for use in automated viewing solutions such as Microsoft HD Viewer
  • Import and correlate image data from any external source through an easy to use interface, resulting in visibility of data that ranges from low- magnification surface imaging to high-magnification, extreme resolution images at the nanoscale
  • Available on any FEI Scanning Electron Microscope [SEM] system – including existing system installations

Download more information:

 > MAPS Product Data Sheet

 > Application Note: Correlative Workflow

Maps Interface
Maps Interface
 
MAPS is compatible with Microsoft HD Viewer

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