European Cryo DualBeam™ Workshop

June 4 – 6, 2008. FEI NanoPort, Eindhoven, The Netherlands
During this workshop we will demonstrate to you the practical applications of a Focused Ion Beam (FIB) instrument in combination with specimen preparation using the most commonly used techniques for Electron Microscopy. You can register right now.

Event Overview

We would like to invite you to join FEI’s Cryo-DualBeam™ Workshop to be held June 4th through the 6th, 2008, at our European NanoPort in Eindhoven, The Netherlands. The meeting is aimed at life science and general microscopy users. The plan is to have presentations, tutorials, FEI updates, practical workshops and feedback sessions. In addition, some of the presentations are expected to be delivered by invited speakers. Our Cryo and DualBeam applications experts, systems and service personnel will be available to help you with practical tips, suggestions, as well as to answer any specific questions you may have.

We look forward to welcoming you at FEI’s European NanoPort.

Register Now

We request that every participant use this registration form, as this sheet will be the only official means of registration. Registration and participation in this workshop is being provided by FEI Company free of charge. Airfare, lodging and ground transportation are the responsibility of the attendee.

Thank you and we are looking forward to seeing you in the European NanoPort this June.

Be sure to register early as space is limited!

FEI NanoPort, Eindhoven, The Netherlands


Hotel Information
FEI has reserved hotel rooms at the Novotel Hotel in Eindhoven.