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Circuit Edit

Rewiring Chips with FIB Circuit Edit

Speed-Up Design Validation & Performance Optimization
As geometries shrink, editing smaller circuits requires more precise FIB imaging and machining. Attend this 30 minute web cast and learn from FEI’s leading circuit edit experts how the latest FIB technologies and techniques address these important challenges.

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Additional Resources FIB-modified circuit  High-aspect ratio filled with tungsten 

Circuit edit helps reduce time-to-market in the release of any electronic component. When the first articles produced don't conform to the intended design, modifications to the circuit must be identified and tested very quickly and cost-effectively. Re-making the advanced masks used in today's integrated circuit devices without a known, tested solution would be costly, and might require multiple iterations.

Circuit edit, using focused ion beam technology, allows device manufacturers to identify and correct problems within their component by breaking and making electrical connections at the nanoscale. In addition, Circuit Edit produces functional prototypes, which allows validation teams to continue product development in parallel with the production of corrected masks.

FEI's V600 family of tools are used to perform circuit edit applications.

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Imaging and Analysis Tools

Get to data. Faster. Use the world’s finest suite of integrated tools for the semiconductor lab.View [PDF 924KB]

Related Information

Whitepaper: Circuit Edit Basics - The basics of FIB for CE, demonstrating how you can speed-up time-to-market and get a jump on the next round of modifications a device may need. View [PDF 543KB ]
Whitepaper: Circuit Edit Tips & Tricks: Six critical skills for successful CE that you can apply, including tips for preparation, charge control, reference marks, metal exposure, focus and consistency. View [PDF 276KB]
Whitepaper: Low keV FIB Applications for Circuit EditView [PDF 4.8MB]
Whitepaper: Backside Circuit Edit on Full-Thickness Silicon DevicesView [PDF 2.5MB]