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Biophysical Society Meeting 2012San Diego, CAFeb 25, 2012 - Feb 29, 2012
BioMedicine in 4D ConferencePortland, OregonMar 22, 2012 - Mar 24, 2012
Focus on Microscopy 2012SingaporeApr 01, 2012 - Apr 04, 2012
The FEI Nova™ NanoSEM line of SEMs provides high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation.
Learn how companies and research institutions worldwide use FEI microscopy solutions for research and analysis.
The revolution in X-ray analytics continues. New 3D chemical mapping capability delivers additional information for a more thorough understanding of the relationship between function, properties and structure, at the nanoscale.
Driving Innovation in Semiconductor and Data Storage
FEI has been producing cutting-edge solutions for the semiconductor and data storage industry for decades. Learn more about our market-leading instruments.
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TIA for Windows 7
1/27/2012 Posted by: duttai@corning.comViews: 6 Replies: 0
using an 835 for TEM prep and liftout
8/22/2011 Posted by: mattlangViews: 39 Replies: 1
TIA Software
8/16/2011 Posted by: spratt1Views: 85 Replies: 1
Read the FEI booklet "An Introduction to Electron Microscopy", an excellent resource on electron microscopy and nanotechnology for students and teachers.
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The American Recovery and Reinvestment Act of 2009 (“ARRA”) is an unprecedented $787 billion economic stimulus package signed into law by President Barack Obama on February 17, 2009. The Recovery Act, or Stimulus Plan, as it is also referred to, includes substantial federal spending in the areas of science, health care, energy, instrumentation and infrastructure modernization.
C. Kisielowski, R. Erni, J. Meyer, Imaging & Microscopy 10 (August 2008) 24-2
Learn how electron microscopy is helping scientists and technologist develop and discover clean, sustainable sources of energy.
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