The latest materials advancements are taking place at the nanoscale. Novel nano-structured materials, carbon nanotubes, nano-crystals and nano-particles require 2D and 3D characterization and qualification. FEI's imaging and analysis tools are capable of an imaging and analytical range from a few nanometer resolutions down to sub-Ângström resolution.
Wide-range scanning and transmission electron microscopy (SEM and TEM) provides the resolution required to qualify these materials for nanomaterials preparation and processes. Structural information, such as morphology and crystallography, as well as chemical, magnetic and electrical, strain and stress information can be obtained with various degrees of resolution and a wide variety of sample classes.
DualBeam™ microscopy adds the power of the focused ion beam (FIB) for site-specific cross-sectioning in order to gain a better understanding of the materials below their surfaces.
Microscopes for Materials Qualification:
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