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SCANDEMCopenhagen, DenmarkMay 13, 2013 - May 18, 2013
ASMCSaratoga Springs, New YorkMay 14, 2013 - May 16, 2013
Japanese Society of MicroscopyOsaka, JapanMay 20, 2013 - May 22, 2013
The FEI Nova™ NanoSEM line of SEMs provides high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation.
FEI’s Tecnai™ with iCorr™, combines fluorescence light and electron microscopes into a single, harmonized instrument for faster throughput and time-to-data, plus greater efficiency with the least amount of sample handling.
FEI has changed the way correlative microscopy is conducted, with new solutions designed for ease of use, accuracy and efficiency. Both light and electron microscopists will appreciate FEI’s comprehensive methods.
The revolution in X-ray analytics continues. New 3D chemical mapping capability delivers additional information for a more thorough understanding of the relationship between function, properties and structure, at the nanoscale.
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Enhance system responsiveness and reduce system downtime through remote diagnostics, access to factory experts, and real-time assistance.
Imaging and patterning Silicon Nitride (Si3N4)
5/3/2013 Posted by: liesbet.vanlandschoot@intec.ugent.beViews: 4 Replies: 0
Titan/Tecnai User Interface on Secondary Display?
1/30/2013 Posted by: mms3sf@virginia.eduViews: 18 Replies: 0
Bugs on the NanoSEM
1/15/2013 Posted by: trevor@psu.eduViews: 26 Replies: 0
Read the FEI booklet "An Introduction to Electron Microscopy", an excellent resource on electron microscopy and nanotechnology for students and teachers.
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CorrSight gives you a suite of products that optimizes the major steps within the correlative workflow. To meet specific imaging needs, users can configure a fully automated correlative imaging system by choosing from FEI’s innovative portfolio of light microscopy modules.
At the core of FEI’s CorrSight is a sample stage that allows for uncompromised compatibility with different sample environments and peripherals, as well as optimal support for multiple correlative applications. A high-end fluorescence microscope is moved precisely to scan the complete sample, allowing for high-speed image acquisition and a broad choice of applications, including the following:
For sophisticated experiments, FEI’s CorrSight can be complemented by numerous modules.
Register to watch one of our pre-recorded webcasts on correlative microscopy and learn more about FEI's full suite of correlative microscopy solutions.
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Read about CorrSight in Genetic Engineering and Biotechnology News
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