Particles come in many forms, and understanding their morphology and chemistry are critical in discerning their origin. Particle detection and analysis encompasses numerous applications in a variety of industries, and it can have a direct effect on the success of a manufacturing process.
Particle detection may require scanning large areas of samples automatically and performing recorded analysis on specific types or simple manual inspection of a specimen to locate a typical example—these are routine applications for FEI scanning electron microscopes (SEMs).
Particle characterization may require a simple image, or perhaps, a much more detailed 3D morphological and chemical analysis. This is possible regardless of the size of the particle you need to characterize. 3D studies can be completed for particles up to several hundred microns in diameter using the FEI Quanta 200 3D, to just a few Ångströms across using a TEM from FEI's Tecnai family.
Because FEI offers a broad range of charged particle microscopy tools, we are uniquely positioned to help resolve your particle detection and analysis problem. Learn more about the Quanta 200 3D and the Tecnai G2 F20 TWIN for particle detection and analysis: